Low-cost optical thin film measurement device
An optical thin film measurement device that combines reflectance spectroscopy and curve fitting methods.
Optical thin film measurement device combining reflectance spectroscopy and curve fitting method ■□■Features■□■ ■By analyzing the reflection from the interface between the surface of a transparent or translucent thin film and the substrate, analysis can be easily performed in just a few seconds. ■In addition to measuring film thickness, this single device can also measure optical constants, allowing for the registration of original materials and operation tailored to the user's applications. ■A powerful and simple low-cost system. ■For more details, please download the catalog or contact us.
- Company：レスター システムビジネスユニット
- Price：Other
